Raman Spectroscopy of Amorphous Indium Oxide Thin Films in the Ultra-Low Frequency Region

by Mr. Itai Zbeda

Ben-Gurion University Of The Negev

at Quantum optics seminar

Wed, 26 May 2021, 15:00
ZOOM

Abstract

Zoom link: https://us02web.zoom.us/j/85487879735

Student seminar!

Determination and characterization of the structural and thermodynamic properties in amorphous, or glassy materials is of much interest and has always been a great challenge. One of the unique characteristics of these materials, observed in their Raman scattering spectra, is the appearance of a broad, asymmetric, low frequency band, named the ‘boson peak’ (BP). This peak is attributed to the contribution of low-frequency phonons to an excess density of states (DOS), over the standard Debye model. These low-frequency vibrational modes (~70 cm-1) change the DOS function of the material, and consequently its thermodynamic properties. Here, an ultra-low frequency (ULF) Raman microscope was built and optimized, which allowed measurements of Raman spectra down to 10 cm−1, including the amorphous InxO thin films BP spectra for the first time. The amorphous InxO thin films Raman spectra were taken under different conditions such as varying stoichiometry, annealing, and laser irradiation. The measured spectra revealed new insights which were yet to be observed in the BP, which are consistent with the structural changes in the amorphous InxO thin films.

Created on 23-05-2021 by Folman, Ron (folman)
Updaded on 23-05-2021 by Folman, Ron (folman)